November 19th, 2019 Reservoir Properties from XRF Elemental Data
Meeting space generously donated by Katalyst DM but space is limited so please RSVP.
We are excited to have Thomas Weedmark with XRF Solutions presenting “Reservoir Properties from XRF Elemental Data“.
Determination of Reservoir Properties from XRF Elemental Data in the Duvernay Formation
Portable X-Ray Fluorescence (XRF) instruments allow a large amount of data to be obtained rapidly, with minimal sample preparation or drilling impact, and at low cost. Rock powders, cuttings, slabs or core faces can be analyzed directly using this non-destructive technique. XRF analyses provide highly precise, and if calibrated properly, accurate data on the bulk chemistry. Proprietary normative mineral algorithms are applied in order to convert the elemental chemical data to mineralogy. Mineral abundances determined from the XRF analyses correlate well with those obtained by X-Ray Diffraction, thin section point counting and SEM analyses.
Mineralogy and trace element data are used to determine reservoir properties through a set of semi-empirical equations. Porosity, permeability and mechanical properties, including Poisson’s ratio and Young’s modulus, determined by XRF algorithms correlate well with values obtained from wireline logs and lab analyses in vertical wells.
Thomas Weedmark is the President and co-founder of XRF Solutions. He is the main advisor, working with clients to develop models and assist in finding new approaches to geologic problems using X-Ray Fluorescence.
Many thanks to Katalyst for providing us with space for our “CGDMS Presents” talks. Without their very kind sponsorship of our Society we would not be where we are today.
Upcoming CGDMS Presents Talks: